Contactless VLSI Measurement and Testing Techniques - Sayil - Books - Springer International Publishing AG - 9783319696720 - December 4, 2017
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Sayil
Contactless VLSI Measurement and Testing Techniques 1st ed. 2018 edition

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The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.

93 pages, 11 Illustrations, color; 23 Illustrations, black and white; V, 93 p. 34 illus., 11 illus.

Media Books     Book
Released December 4, 2017
ISBN13 9783319696720
Publishers Springer International Publishing AG
Pages 93
Dimensions 150 × 220 × 20 mm   ·   343 g
Language German  

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