Noncontact Atomic Force Microscopy - NanoScience and Technology - Roland Wiesendanger - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783540431176 - July 24, 2002
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Roland Wiesendanger
Noncontact Atomic Force Microscopy - NanoScience and Technology 2002 edition

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS);

458 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released July 24, 2002
ISBN13 9783540431176
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 440
Dimensions 164 × 241 × 35 mm   ·   766 g
Language German  
Editor Meyer, E.
Editor Morita, S.
Editor Wiesendanger, Roland

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