Surface and Interface Characterization by Electron Optical Methods - Nato ASI Subseries B: - Ugo Valdre - Books - Springer-Verlag New York Inc. - 9781461595397 - November 25, 2012
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Ugo Valdre
Surface and Interface Characterization by Electron Optical Methods - Nato ASI Subseries B: Softcover reprint of the original 1st ed. 1988 edition

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The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident.

319 pages, 156 black & white illustrations, 3 colour illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 25, 2012
Original release date 1989
ISBN13 9781461595397
Publishers Springer-Verlag New York Inc.
Pages 319
Dimensions 170 × 244 × 17 mm   ·   530 g
Language English  
Editor Valdre, Ugo

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