Multi-chip Module Test Strategies - Frontiers in Electronic Testing - Yervant Zorian - Books - Kluwer Academic Publishers - 9780792399209 - May 31, 1997
In case cover and title do not match, the title is correct

Multi-chip Module Test Strategies - Frontiers in Electronic Testing Reprinted from Journal of Electronic Testing, 10:1 edition

Yervant Zorian

Price
CA$ 171.99

Ordered from remote warehouse

Expected delivery Dec 20 - Jan 2, 2025
Christmas presents can be returned until 31 January

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Multi-chip Module Test Strategies - Frontiers in Electronic Testing Reprinted from Journal of Electronic Testing, 10:1 edition

This volume of research presents updated test strategies for MCMs. It is designed for engineers interested in practical implementations of MCM test solutions and for designers seeking current test and design-for-testability solutions for their next designs.

167 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released May 31, 1997
ISBN13 9780792399209
Publishers Kluwer Academic Publishers
Pages 167
Dimensions 203 × 254 × 11 mm   ·   535 g
Language English  
Editor Zorian, Yervant

See all of Yervant Zorian ( e.g. Hardcover Book )