Reflection Electron Microscopy and Spectroscopy for Surface Analysis - Wang, Zhong Lin (Georgia Institute of Technology) - Books - Cambridge University Press - 9780521482660 - May 23, 1996
In case cover and title do not match, the title is correct

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Wang, Zhong Lin (Georgia Institute of Technology)

Price
CA$ 216.49

Ordered from remote warehouse

Expected delivery Aug 1 - 15

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Also available as:

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM.

456 pages, 224 b/w illus. 10 tables

Media Books     Hardcover Book   (Book with hard spine and cover)
Released May 23, 1996
ISBN13 9780521482660
Publishers Cambridge University Press
Pages 458
Dimensions 170 × 244 × 25 mm   ·   1.10 kg

See all of Wang, Zhong Lin (Georgia Institute of Technology) ( e.g. Paperback Book and Hardcover Book )