Built In Test for VLSI: Pseudorandom Techniques - Bardell, Paul H. (IBM Corporation, Armonk, NY) - Books - John Wiley & Sons Inc - 9780471624639 - December 2, 1987
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Built In Test for VLSI: Pseudorandom Techniques

Bardell, Paul H. (IBM Corporation, Armonk, NY)

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Built In Test for VLSI: Pseudorandom Techniques

Presents the major concepts, techniques, problems and solutions in the emerging field of pseudorandom pattern testing. The intention of this book is to present the material in a unified manner, making it a useful source for practising professionals and students.

368 pages, Ill.

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 2, 1987
ISBN13 9780471624639
Publishers John Wiley & Sons Inc
Pages 368
Dimensions 165 × 240 × 23 mm   ·   610 g

See all of Bardell, Paul H. (IBM Corporation, Armonk, NY) ( e.g. Hardcover Book )