Applied Measurement with jMetrik - Meyer, J. Patrick (University of Virginia, USA) - Books - Taylor & Francis Ltd - 9780415531979 - June 25, 2014
In case cover and title do not match, the title is correct

Meyer, J. Patrick (University of Virginia, USA)
Applied Measurement with jMetrik 1st edition

Price
CA$ 120.49
excl. VAT

Ordered from remote warehouse

Expected delivery Nov 5 - 23
Christmas presents can be returned until 31 January
Get notified about new Meyer, J. Patrick (University of Virginia, USA) releases

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Not rated yet

Also available as:

Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis.

55 black & white illustrations, 4 black & white tables, 19 black & white line drawings

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 25, 2014
ISBN13 9780415531979
Publishers Taylor & Francis Ltd
Pages 170
Dimensions 229 × 153 × 9 mm   ·   266 g
Language English  

More from the same publisher

See all of Meyer, J. Patrick (University of Virginia, USA)