Reliability Prediction from Burn-In Data Fit to Reliability Models - Bernstein, Joseph (Ariel University, Ariel, Israel.) - Books - Elsevier Science Publishing Co Inc - 9780128007471 - March 21, 2014
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Bernstein, Joseph (Ariel University, Ariel, Israel.)
Reliability Prediction from Burn-In Data Fit to Reliability Models

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Helps you educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level.

108 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released March 21, 2014
ISBN13 9780128007471
Publishers Elsevier Science Publishing Co Inc
Pages 108
Dimensions 154 × 228 × 6 mm   ·   154 g
Language English  

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