Mems Reliability For Critical and Space Applications - Lawton - Books - SPIE Press - 9780819434777 - August 31, 1999
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Mems Reliability For Critical and Space Applications

Lawton

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Mems Reliability For Critical and Space Applications

A selection of scientific papers on the reliability of microelectromechanical systems (MEMS) for critical and space applications.

176 pages, illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released August 31, 1999
ISBN13 9780819434777
Publishers SPIE Press
Pages 176
Dimensions 393 g   (Weight (estimated))
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